M. Salluzzo, S. Gariglio, X. Torrelles, Z. Ristic, R. Di Capua, J. Drnec, M. Moretti Sala, G. Ghiringhelli, R. Felici, N.B. Brookes
Advanced Materials, 16, 25(2013), pp 2333–2338
Publication year: 2013

A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.